The following publications are possibly variants of this publication:
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- Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan TestingChun-Yong Liang, Meng-Fan Wu, Jiun-Lang Huang. ats 2010: 361-366 [doi]
- Power supply noise and its reduction in at-speed scan testingXiaoqing Wen. asicon 2015: 1-4 [doi]
- PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression EnvironmentYi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang. ats 2008: 391-396 [doi]
- A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environmentKohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara. iccad 2009: 97-104 [doi]