External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Wafer-scale grating mapping system for rapid pitch and diffraction efficiency measurement

Zon-Ru Wu, Tzu-Chieh Kao, Chia-Wei Kao, Ping-Chien Chang, Wei Lin, Yung-Jr Hung. Wafer-scale grating mapping system for rapid pitch and diffraction efficiency measurement. In 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC), Fukuoka, Japan, July 7-11, 2019. pages 1-3, IEEE, 2019. [doi]

Abstract

Abstract is missing.

runs on