Identification of robust untestable path delay faults

Wen Ching Wu, Chung-Len Lee, Jwu E. Chen. Identification of robust untestable path delay faults. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 229, IEEE Computer Society, 1995. [doi]

Authors

Wen Ching Wu

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Chung-Len Lee

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Jwu E. Chen

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