Wen Ching Wu, Chung-Len Lee, Jwu E. Chen. Identification of robust untestable path delay faults. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 229, IEEE Computer Society, 1995. [doi]
@inproceedings{WuLC95:0,
title = {Identification of robust untestable path delay faults},
author = {Wen Ching Wu and Chung-Len Lee and Jwu E. Chen},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/ats/1995/7129/00/71290229abs.htm},
tags = {e-science},
researchr = {https://researchr.org/publication/WuLC95%3A0},
cites = {0},
citedby = {0},
pages = {229},
booktitle = {4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-8186-7129-7},
}