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Microcontroller susceptibility variations to EFT burst during accelerated aging

J. Wu, C. Li, B. Li, W. Zhu, H. Wang. Microcontroller susceptibility variations to EFT burst during accelerated aging. Microelectronics Reliability, 64:210-214, 2016. [doi]

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J. Wu

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C. Li

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B. Li

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W. Zhu

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H. Wang

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