J. Wu, C. Li, B. Li, W. Zhu, H. Wang. Microcontroller susceptibility variations to EFT burst during accelerated aging. Microelectronics Reliability, 64:210-214, 2016. [doi]
@article{WuLLZW16,
title = {Microcontroller susceptibility variations to EFT burst during accelerated aging},
author = {J. Wu and C. Li and B. Li and W. Zhu and H. Wang},
year = {2016},
doi = {10.1016/j.microrel.2016.07.099},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.099},
researchr = {https://researchr.org/publication/WuLLZW16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {210-214},
}