Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
J. Wu, C. Li, B. Li, W. Zhu, H. Wang. Microcontroller susceptibility variations to EFT burst during accelerated aging. Microelectronics Reliability, 64:210-214, 2016. [doi]
Abstract is missing.