David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher. An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 38-47, IEEE, 2004. [doi]
Abstract is missing.