SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence

Ching Ping Wu, Chung-Len Lee, Wen-Zen Shen. SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence. In Gerald Musgrave, editor, Proceedings of the conference on European design automation, EURO-DAC '92, Hamburg, Germany, September 7-10, 1992. pages 446-449, IEEE Computer Society Press, 1992. [doi]

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