SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence

Ching Ping Wu, Chung-Len Lee, Wen-Zen Shen. SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence. In Gerald Musgrave, editor, Proceedings of the conference on European design automation, EURO-DAC '92, Hamburg, Germany, September 7-10, 1992. pages 446-449, IEEE Computer Society Press, 1992. [doi]

@inproceedings{WuLS92,
  title = {SEESIM - a fast synchronous sequential circuit fault simulator with single event equivalence},
  author = {Ching Ping Wu and Chung-Len Lee and Wen-Zen Shen},
  year = {1992},
  url = {http://dl.acm.org/citation.cfm?id=161790},
  researchr = {https://researchr.org/publication/WuLS92},
  cites = {0},
  citedby = {0},
  pages = {446-449},
  booktitle = {Proceedings of the conference on European design automation, EURO-DAC '92, Hamburg, Germany, September 7-10, 1992},
  editor = {Gerald Musgrave},
  publisher = {IEEE Computer Society Press},
  isbn = {0-8186-2780-8},
}