Reduced-reference image quality assessment with local binary structural pattern

Jinjian Wu, Weisi Lin, Guangming Shi, Long Xu. Reduced-reference image quality assessment with local binary structural pattern. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 898-901, IEEE, 2014. [doi]

Authors

Jinjian Wu

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Weisi Lin

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Guangming Shi

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Long Xu

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