Reduced-reference image quality assessment with local binary structural pattern

Jinjian Wu, Weisi Lin, Guangming Shi, Long Xu. Reduced-reference image quality assessment with local binary structural pattern. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 898-901, IEEE, 2014. [doi]

@inproceedings{WuLSX14,
  title = {Reduced-reference image quality assessment with local binary structural pattern},
  author = {Jinjian Wu and Weisi Lin and Guangming Shi and Long Xu},
  year = {2014},
  doi = {10.1109/ISCAS.2014.6865281},
  url = {http://dx.doi.org/10.1109/ISCAS.2014.6865281},
  researchr = {https://researchr.org/publication/WuLSX14},
  cites = {0},
  citedby = {0},
  pages = {898-901},
  booktitle = {IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014},
  publisher = {IEEE},
}