Oscillation Ring Delay Test for High Performance Microprocessors - researchr publication authors

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Wen Ching Wu, Chung-Len Lee, Ming Shae Wu, Jwu E. Chen, Magdy S. Abadir. Oscillation Ring Delay Test for High Performance Microprocessors. J. Electronic Testing, 16(1-2):147-155, 2000. [doi]

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