Oscillation Ring Delay Test for High Performance Microprocessors

Wen Ching Wu, Chung-Len Lee, Ming Shae Wu, Jwu E. Chen, Magdy S. Abadir. Oscillation Ring Delay Test for High Performance Microprocessors. J. Electronic Testing, 16(1-2):147-155, 2000. [doi]

Abstract

Abstract is missing.