Automatic fabric defect detection using a wide-and-light network - researchr publication authors

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Jun Wu 0014, Juan Le, Zhitao Xiao, Fang Zhang, Lei Geng, Yanbei Liu, Wen Wang. Automatic fabric defect detection using a wide-and-light network. Appl. Intell., 51(7):4945-4961, 2021. [doi]

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