Jun Wu 0014, Juan Le, Zhitao Xiao, Fang Zhang, Lei Geng, Yanbei Liu, Wen Wang. Automatic fabric defect detection using a wide-and-light network. Appl. Intell., 51(7):4945-4961, 2021. [doi]
@article{WuLXZGLW21,
title = {Automatic fabric defect detection using a wide-and-light network},
author = {Jun Wu 0014 and Juan Le and Zhitao Xiao and Fang Zhang and Lei Geng and Yanbei Liu and Wen Wang},
year = {2021},
doi = {10.1007/s10489-020-02084-6},
url = {https://doi.org/10.1007/s10489-020-02084-6},
researchr = {https://researchr.org/publication/WuLXZGLW21},
cites = {0},
citedby = {0},
journal = {Appl. Intell.},
volume = {51},
number = {7},
pages = {4945-4961},
}