Jiang Wu, Yan Lei, Zhuo Zhang 0007, Xiankai Meng, Deheng Yang, Pan Li, Jiayu He, Xiaoguang Mao. Mantra: Mutation Testing of Hardware Design Code Based on Real Bugs. In 60th ACM/IEEE Design Automation Conference, DAC 2023, San Francisco, CA, USA, July 9-13, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.