Kejun Wu, Hoda Pahlevanzadeh, Peng Liu 0016, Qiaoyan Yu. A new fault injection method for evaluation of combining SEU and SET effects on circuit reliability. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 602-605, IEEE, 2014. [doi]
Abstract is missing.