Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 143-152, IEEE, 2021. [doi]
@inproceedings{WuRTMKH21-0,
title = {Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions},
author = {Lizhou Wu and Siddharth Rao and Mottaqiallah Taouil and Erik Jan Marinissen and Gouri Sankar Kar and Said Hamdioui},
year = {2021},
doi = {10.1109/ITC50571.2021.00022},
url = {https://doi.org/10.1109/ITC50571.2021.00022},
researchr = {https://researchr.org/publication/WuRTMKH21-0},
cites = {0},
citedby = {0},
pages = {143-152},
booktitle = {IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1695-5},
}