Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 143-152, IEEE, 2021. [doi]
Abstract is missing.