Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM - researchr publication authors

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Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1717-1722, IEEE, 2021. [doi]

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