Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1717-1722, IEEE, 2021. [doi]

@inproceedings{WuRTMKH21,
  title = {Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM},
  author = {Lizhou Wu and Siddharth Rao and Mottaqiallah Taouil and Erik Jan Marinissen and Gouri Sankar Kar and Said Hamdioui},
  year = {2021},
  doi = {10.23919/DATE51398.2021.9473999},
  url = {https://doi.org/10.23919/DATE51398.2021.9473999},
  researchr = {https://researchr.org/publication/WuRTMKH21},
  cites = {0},
  citedby = {0},
  pages = {1717-1722},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021},
  publisher = {IEEE},
  isbn = {978-3-9819263-5-4},
}