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Research on Path Delay with BTI Recovery Effect

Jiebing Wu, Yongsheng Sun, Yuan Wang, Yukai Lin, Mingna Fan, Junlin Huang. Research on Path Delay with BTI Recovery Effect. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-4, IEEE, 2022. [doi]

Authors

Jiebing Wu

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Yongsheng Sun

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Yuan Wang

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Yukai Lin

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Mingna Fan

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Junlin Huang

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