Jiebing Wu, Yongsheng Sun, Yuan Wang, Yukai Lin, Mingna Fan, Junlin Huang. Research on Path Delay with BTI Recovery Effect. In IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. pages 1-4, IEEE, 2022. [doi]
@inproceedings{WuSWLFH22,
title = {Research on Path Delay with BTI Recovery Effect},
author = {Jiebing Wu and Yongsheng Sun and Yuan Wang and Yukai Lin and Mingna Fan and Junlin Huang},
year = {2022},
doi = {10.1109/ETS54262.2022.9810373},
url = {https://doi.org/10.1109/ETS54262.2022.9810373},
researchr = {https://researchr.org/publication/WuSWLFH22},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6706-3},
}