Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains

Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu. Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(3):455-463, 2011. [doi]

@article{WuWWJTZHJHLHY11,
  title = {Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains},
  author = {Shianling Wu and Laung-Terng Wang and Xiaoqing Wen and Zhigang Jiang and Lang Tan and Yu Zhang and Yu Hu and Wen-Ben Jone and Michael S. Hsiao and James Chien-Mo Li and Jiun-Lang Huang and Lizhen Yu},
  year = {2011},
  doi = {10.1109/TCAD.2010.2092510},
  url = {http://dx.doi.org/10.1109/TCAD.2010.2092510},
  tags = {testing},
  researchr = {https://researchr.org/publication/WuWWJTZHJHLHY11},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {30},
  number = {3},
  pages = {455-463},
}