Prototyping memristors in digital system with an FPGA-based testing environment

Daniel Wust, Mehrdad Biglari, Johannes Kncodtel, Marc Reichenbach, Christopher Söll, Dietmar Fey. Prototyping memristors in digital system with an FPGA-based testing environment. In 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017, Thessaloniki, Greece, September 25-27, 2017. pages 1-7, IEEE, 2017. [doi]

Abstract

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