Two-Regime Drift in Electrolytically Gated FETs and BioFETs

R. Wuytens, S. Santermans, M. Gupta, B. Du Bois, S. Severi, L. Lagae, W. Van Roy, K. M. Martens. Two-Regime Drift in Electrolytically Gated FETs and BioFETs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]

Abstract

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