David R. Wyble, Hongqin Zhang. Colorimetric Characterization Model for DLP Projectors. In The Eleventh Color Imaging Conference: Color Science and Engineering Systems, Technologies, Applications, CIC 2003, November 3, 2003, Scottsdale, Arizona, USA. pages 346-350, IS&T - The Society for Imaging Science and Technology, 2003. [doi]
Abstract is missing.