External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen. Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst., 25(5), 2020. [doi]

Authors

Nektar Xama

This author has not been identified. Look up 'Nektar Xama' in Google

Martin Andraud

This author has not been identified. Look up 'Martin Andraud' in Google

Jhon Gomez

This author has not been identified. Look up 'Jhon Gomez' in Google

Baris Esen

This author has not been identified. Look up 'Baris Esen' in Google

Wim Dobbelaere

This author has not been identified. Look up 'Wim Dobbelaere' in Google

Ronny Vanhooren

This author has not been identified. Look up 'Ronny Vanhooren' in Google

Anthony Coyette

This author has not been identified. Look up 'Anthony Coyette' in Google

Georges G. E. Gielen

This author has not been identified. Look up 'Georges G. E. Gielen' in Google
runs on