Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen. Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst., 25(5), 2020. [doi]
@article{XamaAGEDVCG20,
title = {Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations},
author = {Nektar Xama and Martin Andraud and Jhon Gomez and Baris Esen and Wim Dobbelaere and Ronny Vanhooren and Anthony Coyette and Georges G. E. Gielen},
year = {2020},
doi = {10.1145/3408063},
url = {https://doi.org/10.1145/3408063},
researchr = {https://researchr.org/publication/XamaAGEDVCG20},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {25},
number = {5},
}