Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)

Yue Xi, Xinyi Li, Junhao Chen, Ruofei Hu, Qingtian Zhang, Zhixing Jiang, Feng Xu, Jianshi Tang. Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper). In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]

Authors

Yue Xi

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Xinyi Li

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Junhao Chen

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Ruofei Hu

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Qingtian Zhang

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Zhixing Jiang

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Feng Xu

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Jianshi Tang

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