Yue Xi, Xinyi Li, Junhao Chen, Ruofei Hu, Qingtian Zhang, Zhixing Jiang, Feng Xu, Jianshi Tang. Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper). In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{XiLCHZJXT23,
title = {Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)},
author = {Yue Xi and Xinyi Li and Junhao Chen and Ruofei Hu and Qingtian Zhang and Zhixing Jiang and Feng Xu and Jianshi Tang},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118214},
url = {https://doi.org/10.1109/IRPS48203.2023.10118214},
researchr = {https://researchr.org/publication/XiLCHZJXT23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}