Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy

F. Xia, I. Soltani Bozchalooi, Kamal Youcef-Toumi. Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 4141-4146, IEEE, 2017. [doi]

Abstract

Abstract is missing.