A low-cost built-in self-test for CP-PLL based on TDC

Lanhua Xia, Jianhui Wu, Zhikuang Cai, Meng Zhang, Xincun Ji. A low-cost built-in self-test for CP-PLL based on TDC. IEICE Electronic Express, 11(10):20140247, 2014. [doi]

Abstract

Abstract is missing.