Dong Xiang, Krishnendu Chakrabarty, Dianwei Hu, Hideo Fujiwara. Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 329-334, IEEE, 2007. [doi]
Abstract is missing.