Dong Xiang, Jiaming Cai, Bo Liu. Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{XiangCL20,
title = {Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing},
author = {Dong Xiang and Jiaming Cai and Bo Liu},
year = {2020},
doi = {10.1109/VTS48691.2020.9107597},
url = {https://doi.org/10.1109/VTS48691.2020.9107597},
researchr = {https://researchr.org/publication/XiangCL20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5359-9},
}