Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 300-305, IEEE Computer Society, 2003. [doi]
@inproceedings{XiangGF03,
title = {Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis},
author = {Dong Xiang and Shan Gu and Hideo Fujiwara},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510300abs.htm},
tags = {testing, analysis, data-flow analysis, design},
researchr = {https://researchr.org/publication/XiangGF03},
cites = {0},
citedby = {0},
pages = {300-305},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}