Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis - researchr publication

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Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 300-305, IEEE Computer Society, 2003. [doi]

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