A cost-effective scan architecture for scan testing with non-scan test power and test application cost - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu. A cost-effective scan architecture for scan testing with non-scan test power and test application cost. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 744-747, ACM, 2003. [doi]

This author has not been identified. Look up 'Dong Xiang' in GoogleThis author has not been identified. Look up 'Shan Gu' in GoogleThis author has not been identified. Look up 'Jia-Guang Sun' in GoogleThis author has not been identified. Look up 'Yu-Liang Wu' in Google

runs on WebDSL