Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu. A cost-effective scan architecture for scan testing with non-scan test power and test application cost. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003. pages 744-747, ACM, 2003. [doi]
Abstract is missing.