Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture - researchr publication

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Dong Xiang, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, Jiaguang Sun. Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture. IEEE Trans. on Circuits and Systems, 54-II(5):450-454, 2007. [doi]

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