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Dong Xiang, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, Jiaguang Sun. Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture. IEEE Trans. on Circuits and Systems, 54-II(5):450-454, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan ArchitectureDong Xiang, Dianwei Hu, Qiang Xu, Alex Orailoglu. tcad, 28(7):1101-1105, 2009. [doi]
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