Dong Xiang, Janak H. Patel. A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 548-557, IEEE Computer Society, 1996.
@inproceedings{XiangP96,
title = {A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information},
author = {Dong Xiang and Janak H. Patel},
year = {1996},
tags = {design},
researchr = {https://researchr.org/publication/XiangP96},
cites = {0},
citedby = {0},
pages = {548-557},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}