Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

Dong Xiang, Xiaoqing Wen, Laung-Terng Wang. Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding. IEEE Trans. VLSI Syst., 25(3):942-953, 2017. [doi]

Abstract

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