Dong Xiang, Boxue Yin, Krishnendu Chakrabarty. Compact Test Generation for Small-Delay Defects Using Testable-Path Information. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 424-429, IEEE Computer Society, 2009. [doi]
Abstract is missing.