Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure - researchr publication authors

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Dong Xiang, Boxue Yin, Kwang-Ting Cheng. Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 251-256, IEEE Computer Society, 2009. [doi]

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