Dong Xiang, Boxue Yin, Kwang-Ting Cheng. Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 251-256, IEEE Computer Society, 2009. [doi]
@inproceedings{XiangYC09-0,
title = {Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure},
author = {Dong Xiang and Boxue Yin and Kwang-Ting Cheng},
year = {2009},
doi = {10.1109/VTS.2009.14},
url = {http://dx.doi.org/10.1109/VTS.2009.14},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/XiangYC09-0},
cites = {0},
citedby = {0},
pages = {251-256},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}