Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal

Senwei Xiang, Weimin Yang, Ting Wang. Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2022, Jinghong, China, December 5-9, 2022. pages 1157-1161, IEEE, 2022. [doi]

@inproceedings{XiangYW22,
  title = {Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal},
  author = {Senwei Xiang and Weimin Yang and Ting Wang},
  year = {2022},
  doi = {10.1109/ROBIO55434.2022.10011952},
  url = {https://doi.org/10.1109/ROBIO55434.2022.10011952},
  researchr = {https://researchr.org/publication/XiangYW22},
  cites = {0},
  citedby = {0},
  pages = {1157-1161},
  booktitle = {IEEE International Conference on Robotics and Biomimetics, ROBIO 2022, Jinghong, China, December 5-9, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-8109-0},
}