Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal

Senwei Xiang, Weimin Yang, Ting Wang. Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal. In IEEE International Conference on Robotics and Biomimetics, ROBIO 2022, Jinghong, China, December 5-9, 2022. pages 1157-1161, IEEE, 2022. [doi]

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