Chuzhe Xiao, Norman C. Beaulieu. Node Switching Rates of Switch-and-Examine Relaying in Rician and Nakagami-m Fading. In European Wireless 2011, April 27-29, 2011, Vienna, Austria. VDE-Verlag, 2011. [doi]
@inproceedings{XiaoB11-1,
title = {Node Switching Rates of Switch-and-Examine Relaying in Rician and Nakagami-m Fading},
author = {Chuzhe Xiao and Norman C. Beaulieu},
year = {2011},
url = {http://www.vde-verlag.de/proceedings-de/563343103.html},
researchr = {https://researchr.org/publication/XiaoB11-1},
cites = {0},
citedby = {0},
booktitle = {European Wireless 2011, April 27-29, 2011, Vienna, Austria},
publisher = {VDE-Verlag},
isbn = {978-3-8007-3343-9},
}